Ninox ULTRA 640 SWIR

High resolution, low noise, Deep cooled, digital SWIR camera

Raptor Photonics continues to push the boundaries in scientific SWIR imaging with the launch of the Ninox Ultra, a vacuum cooled to -85C InGaAs camera, offering ultra-low dark current for longer exposures of up to 5 minutes. Combining low read noise of <30e- in high gain and dark current of <100e/p/s at -85C, the Ninox Ultra is one of the most sensitive SWIR cameras available on the market. It offers 640x512 resolution and 15um square pixel pitch and runs at 100Hz in full resolution through a CameraLink interface. The Ninox Ultra also offers high-intrascene dynamic range of 70dB enabling simultaneous capture of bright and dark portions of a scene. The Ninox Ultra follows on from the launch of the Ninox 640 and Ninox 1280 cameras, which have attracted a lot of interest in applications including astronomy and in-vivo imaging. The Ninox Ultra is also available for sale in China and Russia.

Sensor Type InGaAs PIN-Photodiode
Active Pixel 640 x 512
Pixel Pitch 15µm x 15µm
Spectral response 0.9μm to 1.7μm
Noise (RMS) <80 electrons Low Gain, <30 electrons High Gain
Quantum Efficiency Peak >77%
Pixel Well Depth Low Gain: 120Ke-, High Gain: 40Ke
Pixel Operability >99.5%
Dark Current <100e/p/s @-80°C
Digital Output Format 16 bit
Exposure time 1µs until Saturation (typical 5 minutes)
Shutter mode Global shutter
Frame Rate 100Hz
Optical Interface C-mount (selection of SWIR lens available)
Camera Setup / Control CameraLink
Trigger interface Trigger IN and OUT - TTL compatible
Power supply 12V DC ±10%
Image Correction RAW or 2 point NUC (Gain & Dark Current) + pixel correction
Functions controlled by serial communication Exposure, intelligent AGC, Non Uniformity Correction, TEC (ROI to be added via firmware at a later date).
Camera Power Consumption Total power consumption <100W
Operating Case Temperature -20˚C to +55˚C
Storage Temperature -30˚C to +60˚C
Dimensions 123.14mm x 89.84mm x 64.00mm (additional mounting holes, M4 or M5)
Weight 916g

Beam Profiling
Hyperspectral Imaging
Semiconductor Inspection
Solar Cell Inspection
Art Inspection