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Owl 1280

High resolution, High Sensitivity, Digital VIS-SWIR Camera


Using a 1280 x 1024 InGaAs sensor from SCD, the OwL 1280 offers visible extension from 0.6µm to 1.7µm to enable high sensitivity imaging. The 10µm x 10µm pixel pitch enables the highest resolution imaging. It will offer less than 50 electrons readout noise (rms) and with a high intra-scene dynamic range of 69dBdB, this enables simultaneous capture of bright & dark portions of a scene.

Available with a 12 bit medium Camera Link digital output, the Owl 1280 will run from 10 to 60Hz. The camera features an on-board Automated Gain Control (AGC) which enables the best contrast image from low to bright light. The camera also has an on-board intelligent 3 point Non Uniform Correction (NUC) providing the highest quality images. As with all Raptor cameras, the Owl 1280 is ultra compact and rugged. The camera sensor temperature is stabilised to 15°C and the camera does not have a fan.

Please note: This product is under the export control of UK government and maybe subject to an Single Individual export licence before shipment.

See our NEW OWL 1280 Video

  • VIS-SWIR technology – Enables high sensitivity imaging from 0.6μm to 1.7μm
  • 10μm x 10μm pixel pitch – Enables the highest resolution VIS-SWIR image
  • <50 electrons readout noise – Enables the highest VIS-SWIR detection limit
  • Ultra high intrascene dynamic range – 69dB – Enables simultaneous capture of bright & dark portions of a scene
  • On-board Automated Gain Control (AGC) – Enables clear video in all light conditions
  • On-board intelligent 3 point NUC – Enables highest quality images
  • Ultra compact, Low power (< 3W) – Ideal for hand-held, mobile or airborne systems
  • Rugged, No fan – Enables integration into UAV, handheld or any Electro-Optic systems

Surveillance

  • HD long-range day/night SWIR imaging
  • Airborne and Ground Payload
  • Hand Held Goggles
  • Driving Vision Enhancement (DVE)
  • Airborne EVS
  • Vision enhancement

Scientific

  • Astronomy
  • Beam Profiling
  • Hyperspectral Imaging
  • Semiconductor Inspection
  • Solar Cell Inspection
  • Thermography